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Electrical properties of single crystal Yttrium Iron Garnet ultra-thin films at high temperatures

机译:单晶钇铁石榴石超薄电性能   高温下的薄膜

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摘要

We report a study on the electrical properties of 19 nm thick Yttrium IronGarnet (YIG) films grown by liquid phase epitaxy. The electrical conductivityand Hall coefficient are measured in the high temperature range [300,400]~Kusing a Van der Pauw four-point probe technique. We find that the electricalresistivity decreases exponentially with increasing temperature following anactivated behavior corresponding to a band-gap of $E_g\approx 2$ eV, indicatingthat epitaxial YIG ultra-thin films behave as large gap semiconductor, and notas electrical insulator. The resistivity drops to about $5\times 10^3$~$\Omega\cdot \text{cm}$ at $T=400$ K. We also infer the Hall mobility, which is foundto be positive ($p$-type) at 5 cm$^2$/(V$\cdot$sec) and about independent oftemperature. We discuss the consequence for non-local transport experimentsperformed on YIG at room temperature. These electrical properties areresponsible for an offset voltage (independent of the in-plane field direction)whose amplitude, odd in current, grows exponentially with current due to Jouleheating. These electrical properties also induce a sensitivity to theperpendicular component of the magnetic field through the Hall effect. In ourlateral device, a thermoelectric offset voltage is produced by a temperaturegradient along the wire direction proportional to the perpendicular componentof the magnetic field (Righi-Leduc effects).
机译:我们报告了对通过液相外延生长的19 nm厚的钇铁石榴石(YIG)薄膜的电性能的研究。使用Van der Pauw四点探针技术在高温[300,400]〜K范围内测量电导率和霍尔系数。我们发现电阻率随温度升高而呈指数下降,该失活行为对应于$ E_g \约2 $ eV的带隙,表明外延YIG超薄膜表现为大间隙半导体,而不是电绝缘体。在$ T = 400 $ K时,电阻率下降到大约$ 5 \乘以10 ^ 3 $〜$ \ Omega \ cdot \ text {cm} $。我们还推断霍尔迁移率是正值($ p $型)在5 cm $ ^ 2 $ /(V $ \ cdot $ sec)左右,并且与温度无关。我们讨论了在室温下在YIG上进行的非本地运输实验的结果。这些电特性对偏移电压(与平面内电场方向无关)负责,偏移电压的振幅(电流为奇数)由于焦耳热而随电流呈指数增长。这些电学特性还通过霍尔效应引起对磁场垂直分量的敏感性。在我们的侧向装置中,沿着电线方向的温度梯度与磁场的垂直分量成比例,从而产生热电补偿电压(Righi-Leduc效应)。

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